How can you detect surface defects on fine wires, even at high speed?

All CERSA's expertise has been deployed to meet a challenge that many manufacturers have been waiting for: the inspection of surface conditions and defect detection during production.

Forget about laboratory sampling techniques on wire pieces: now SQM-F allows real-time and continuous detection on the production line. Analysis and understanding of the detected defects allow a significant improvement of the final product quality, while drastically reducing scraps and saving time for operators. Features that make it a rapidly profitable solution!

The SQM-F offers high-resolution and real-time surface defect detection with 200,000 images per second. Defects such as scratches, die marks, impurities, bubbles, or particles on the insulation are typical examples of analyzed defects. SQM-F was developed to focus on very fine dimensions: wire diameter from 2000μm down to 20 μm!

Released only a few months ago, the SQM-F has already raised strong interest on the part of fine wire and tube manufacturers around the world. Numerous tests have confirmed the detection capabilities of the SQM-F on many applications (bare, coated, enameled, plated wires, thin tubes for medical applications), and several customers have already placed orders.

Using the SQM-F on your lines will provide you with many benefits. It will help you:

• enhance the final quality;
• save money on raw materials;
• drastically reduce waste;
• increase your productivity;
• achieve higher standards and outperform the competition.

Discover in video the measuring principle of the new CERSA device. A truly innovative device capable of detecting defects of a few microns even at high speed!



Visit www.cersa-mci.com to know more about SQM-F, or contact the company at [email protected].