CERSA-MCI
Measuring instruments
FRFrance
1981
11-50

Surface defect detection instrument for fine wires, cables, and tubes

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If you are looking for a surface defect detection instrument for fine wire, cable, and tube, CERSA has you covered. 

The majority of the quality inspection tools available on the market allow for diameter measurement and defect detection during production processes such as drawing or extrusion. However, there has never been a real instrument to continuously inspect the finished product and prevent surface imperfections, like lack of plating, scratches, impurities, bubbles, or particles on the insulation.

SQM-F by CERSA perfectly addresses this very need. Coupled with the corporate software CIM PROD, this tool offers a cutting-edge, patented solution for the in-line inspection of surface quality for diameters ranging from 20 to 2000 µm (0,8 to 80 mils).

Main advantages:
- minimum linear resolution 18μm;
- 100% of the surface covered;
- real-time defect detection;
- 200,000 images per second.

SQM-F can also be combined with a LPS gauge for a complete quality check during all production steps.

 

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last updated on
Wednesday, December 18, 2024